Instrumentation for electrical transport measurements available at the nanoFab is used synergically with electronic nanodevice design and fabrication tools, material properties modeling tools as well as advanced computational resources available within the UNIMORE Scientific Campus ecosystem .
Facilities for Device fabrication and material characterization are available at FIM Department and CIGS – Interdepartmental Large scale facilities (Centro Interdipartimentale Grandi Strumenti), and are exployed in combination with transport measurement setups available at the nanoFab.
This enables device realization and measurement in different transport regimes and several configurations, ranging from atmospheric pressure and temperature to high vacuum and cryogenic temperatures.
EXPERIMENTAL RESOURCES
Nanomaterial & device imaging and morphological characterization:
In order to characterize the nanomaterials employed for device fabrication, we resort on several techniques which include:
- Scanning Electron Microscopy
- micro-Raman spectroscopy
- Atomic Force Microscopy
Device fabrication and packaging:
We have more than 10 years’ experience in the use of facilities for nanodevice fabrication and packaging. Currently our work resort on the use of :
- UV lithography
- Electron Beam Lithography
- Focused Ion Beam
- TPT HB-05 ball bonder
Classical and quantum transport measurements:
Our transport laboratory is furnished with different measurement setups for each specific application we address:
- 3-Probe optical probe station (300 K, 1ATM, in air)
- Room temperature vacuum chamber (300 K, 10-6 mbar)
- Wet cryostats (base temperature 4.2 K)
COMPUTATIONAL AND MODELING RESOURCES
DEVICE DESIGN AND MODELING
- Finite Element Modeling (Comsol Multiphysics, Lumerical)
- Electronic design automation software for Integrated circuit layout editing (Elphy Quantum, klayout)
COMPUTATIONAL RESOURCES
- Multicore workstations
- Access to HPC facilities
- Access to D-Wave for quantum systems simulations